highresolution tem hrtem imaging Search Results


highresolution transmission electron microscopy hrtem images  (JEOL)
97
JEOL highresolution transmission electron microscopy hrtem images
Fig. 1 (a) XRD patterns and (b and c) <t>HRTEM</t> images of pure and 0.41 atom% Ag2S nanocrystals at ambient conditions.
Highresolution Transmission Electron Microscopy Hrtem Images, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/highresolution transmission electron microscopy hrtem images/product/JEOL
Average 97 stars, based on 1 article reviews
highresolution transmission electron microscopy hrtem images - by Bioz Stars, 2026-05
97/100 stars
  Buy from Supplier
highresolution tem hrtem images  (Hitachi Ltd)
99
Hitachi Ltd highresolution tem hrtem images
Fig. 1 (a) XRD patterns and (b and c) <t>HRTEM</t> images of pure and 0.41 atom% Ag2S nanocrystals at ambient conditions.
Highresolution Tem Hrtem Images, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/highresolution tem hrtem images/product/Hitachi Ltd
Average 99 stars, based on 1 article reviews
highresolution tem hrtem images - by Bioz Stars, 2026-05
99/100 stars
  Buy from Supplier
highresolution tem hrtem imaging  (JEOL)
99
JEOL highresolution tem hrtem imaging
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
Highresolution Tem Hrtem Imaging, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/highresolution tem hrtem imaging/product/JEOL
Average 99 stars, based on 1 article reviews
highresolution tem hrtem imaging - by Bioz Stars, 2026-05
99/100 stars
  Buy from Supplier
2100 highresolution transmission electron microscope hrtem  (JEOL)
99
JEOL 2100 highresolution transmission electron microscope hrtem
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
2100 Highresolution Transmission Electron Microscope Hrtem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/2100 highresolution transmission electron microscope hrtem/product/JEOL
Average 99 stars, based on 1 article reviews
2100 highresolution transmission electron microscope hrtem - by Bioz Stars, 2026-05
99/100 stars
  Buy from Supplier
jsm-7500f scanning electron microscope  (JEOL)
97
JEOL jsm-7500f scanning electron microscope
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
Jsm 7500f Scanning Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/jsm-7500f scanning electron microscope/product/JEOL
Average 97 stars, based on 1 article reviews
jsm-7500f scanning electron microscope - by Bioz Stars, 2026-05
97/100 stars
  Buy from Supplier
philips cm200 microscope  (Philips Healthcare)
86
Philips Healthcare philips cm200 microscope
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
Philips Cm200 Microscope, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/philips cm200 microscope/product/Philips Healthcare
Average 86 stars, based on 1 article reviews
philips cm200 microscope - by Bioz Stars, 2026-05
86/100 stars
  Buy from Supplier
onpoint bse detector  (Gatan Inc)
95
Gatan Inc onpoint bse detector
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
Onpoint Bse Detector, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 95/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/onpoint bse detector/product/Gatan Inc
Average 95 stars, based on 1 article reviews
onpoint bse detector - by Bioz Stars, 2026-05
95/100 stars
  Buy from Supplier
microstructure involved highresolution transmission electron microscopy  (Hitachi Ltd)
99
Hitachi Ltd microstructure involved highresolution transmission electron microscopy
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
Microstructure Involved Highresolution Transmission Electron Microscopy, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/microstructure involved highresolution transmission electron microscopy/product/Hitachi Ltd
Average 99 stars, based on 1 article reviews
microstructure involved highresolution transmission electron microscopy - by Bioz Stars, 2026-05
99/100 stars
  Buy from Supplier
hrtem analysis  (JEOL)
98
JEOL hrtem analysis
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
Hrtem Analysis, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/hrtem analysis/product/JEOL
Average 98 stars, based on 1 article reviews
hrtem analysis - by Bioz Stars, 2026-05
98/100 stars
  Buy from Supplier
su8600  (Hitachi Ltd)
99
Hitachi Ltd su8600
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
Su8600, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/su8600/product/Hitachi Ltd
Average 99 stars, based on 1 article reviews
su8600 - by Bioz Stars, 2026-05
99/100 stars
  Buy from Supplier
digitalmicrograph software  (Gatan Inc)
93
Gatan Inc digitalmicrograph software
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
Digitalmicrograph Software, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 93/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/digitalmicrograph software/product/Gatan Inc
Average 93 stars, based on 1 article reviews
digitalmicrograph software - by Bioz Stars, 2026-05
93/100 stars
  Buy from Supplier
jeol jem f200 instrument  (JEOL)
99
JEOL jeol jem f200 instrument
Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative <t>TEM</t> image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).
Jeol Jem F200 Instrument, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/jeol jem f200 instrument/product/JEOL
Average 99 stars, based on 1 article reviews
jeol jem f200 instrument - by Bioz Stars, 2026-05
99/100 stars
  Buy from Supplier

Image Search Results


Fig. 1 (a) XRD patterns and (b and c) HRTEM images of pure and 0.41 atom% Ag2S nanocrystals at ambient conditions.

Journal: RSC Advances

Article Title: Effect of Y doping on high-pressure behavior of Ag2S nanocrystals

doi: 10.1039/c7ra05327d

Figure Lengend Snippet: Fig. 1 (a) XRD patterns and (b and c) HRTEM images of pure and 0.41 atom% Ag2S nanocrystals at ambient conditions.

Article Snippet: The phase impurity, structure, and crystal size of the above synthesized samples were characterized by analyzing X-ray diffraction (XRD) data recorded on an X-ray power diffractometer (Shimadzu, XRD6000) with Cu Kalpha radiation (l 1⁄4 1.5406 Å), and highresolution transmission electron microscopy (HRTEM) images acquired using a JEOL JEM-2200FS at 200 kV at ambient conditions.

Techniques:

Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative TEM image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).

Journal: Journal of Materials Chemistry A

Article Title: 3D printed inks of two-dimensional semimetallic MoS2/TiS2 nanosheets for conductive-additive-free symmetric supercapacitors

doi: 10.1039/d3ta02508j

Figure Lengend Snippet: Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative TEM image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).

Article Snippet: Highresolution TEM (HRTEM) imaging was performed using a JEOL JEM-2100F microscope with a eld-emission gun operated at 200 kV accelerating voltage.

Techniques: